Teaching Experience
All the teachers and courses at IIT Madras are evaluated by the students who attend the course, referred to as the Teacher Course Feedback (TCF).
| Theory courses taught by at IIT Madras (PG and UG) | |||||
|---|---|---|---|---|---|
| S No. | Title of the Course | Credits | No. of Students | Semester | TCF |
| 1. | Semiconductor Physics and Devices (PH6012) | 9 | 20 | Jan - May 2018 | --- |
| 2. | Thin films Science and Technology (PH5670) | 9 | 23 | July - Nov 2018 | Mean: 0.9 Median: 0.96 |
| 3. | Nanomaterials and Nanotechnology (PH6011) | 9 | 42 | Jan - May 2019 | Mean: 0.88 Median: 0.93 |
| 4. | Thin films Science and Technology (PH5670) | 9 | 21 | July - Nov 2019 | Mean: 0.87 Median: 0.87 |
| 5. | Nanomaterials and Nanotechnology (PH6011) | 9 | 39 (Online) | Jan - May 2020 | Mean: 0.88 Median: 0.87 |
| 6. | Thin films Science and Technology (PH5670) | 9 | 22 (online) | July - Nov 2020 | Mean:0.89 Meadian:0.96 |
| 7. | Foundations in Experimental Physics (PH7090) | 12 | 33 (online) | July - Nov 2020 | Mean:0.87 Meadian:0.88 |
| 8. | Nanomaterials and Nanotechnology (PH6011) | 9 | 37 (online) | Jan - May 2021 | Mean: 0.89 Median: 0.91 |
| 9. | Electronics (PH5040) | 9 | 63 (online) | July - Nov 2021 | Mean: 0.83 Median: 0.83 |
| 10. | Physics-II (PH1020)-- UG | 9 | 280 (online) | Jan - May 2022 | --- |
| Laboratory courses handled at IIT Madras | |||
|---|---|---|---|
| S No. | Title of the Course | Semester | TCF |
| 1. | EP-3290 (B.Tech) | Jan-May 2018 | --- |
| 2. | PH-5060 (M.Sc) | July-Nov 2018 | 0.80 |
| 3. | PH-5350 (M.Tech) | Jan-May 2019 | 0.98 |
| 4. | PH-6015 (ID-M.Tech) | Jan-May 2019 | 0.7 |
| 5. | PH-1030 (B.Tech) | July-Nov 2019 | 0.77 |
| 6. | PH-5060 (M.Sc) | July-Nov 2019 | 0.83 |
| 7. | PH-5120(M.Sc) | Jan-May 2020 | Online |
| 8. | PH-5330 (M.Tech) | July-Nov 2020 | Online |
| 9. | PH-5350 (M.Tech) | Jan-May 2021 | Online |
| 10. | PH-5330 (M.Tech) | July-Nov 2021 | Online |
Technical Skills
10 years of experience in clean room (Class 100& 1000) in nanoscale device fabrication as well as characterization at NNFC&MNCF (CeNSE, IISc Bangalore) and CNNP (Electrical Engineering, IIT Madras
Device fabrication and Processing (Independent user)
- Electron Beam Lithography (Raith series e-line, pioneer and 150)
- Optical lithography (Mask aligners: MJB4 and EVG)
- Reactive Ion Etching (Oxford instruments)
- E-beam evaporation
- RF/DC Magnetron sputtering
- Ion Beam Sputtering
- Thermal Evaporation
- Plasma enhanced chemical vapour deposition
Characterization Techniques Handled/used
- Temperature dependent electrical transport measurement systems ( Semiconductor Parametric Analysers)
- Capacitance Voltage measurement system (Impedance analyser)
- Sheet resistance measurement-van der Pauw method
- Polarization-Electric field measurement system (Multiferroic test system-Radiant technologies)
- Optoelectronic device characterization
- Ellipsometer (Woollam M-2000UI)
- X-ray photoelectron Spectroscopy (Specs-GmbH and Axis Ultra)
- X-ray Diffraction (Rigaku make)
- Rutherford Back Scattering (RBS)
- Raman Spectrometer (Lab Ram)
- Fourier Transform Infrared Spectroscopy (FTIR)
- UV-Vis-Spectrometer (Perkinelmar)
- Scanning Electron Microscope (JEOL JSM 840A, FEI Quanta 200)